Charged point defects in semiconductors and the supercell approximation

Journal of Physics Condensed Matter

Volumn 14, Issue 10, 2002, Pages 2637-2645

  Lento, J ^a   Mozos, J L ^a   Nieminen, R M ^a  

^a AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CALCULATIONS; ELECTRIC CHARGE; ELECTRIC INSULATING MATERIALS; POINT DEFECTS;

CHARGED POINT DEFECTS; COULOMB ENERGY; POSITIVE SILICON SELF INTERSTITIAL; SUPERCELL SIZE;

SEMICONDUCTING SILICON;

EID: 0037128708     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/14/10/314     Document Type: Article

References (12)