Piezoreflectance study of the band-edge excitons of ReS2

Solid State Communications

Volumn 103, Issue 1, 1997, Pages 19-23

  Ho, C H ^a   Liao, P C ^a   Huang, Y S ^a   Tiong, K K ^b  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

Author keywords

A. semiconductors; D. optical properties; E. piezoreflectance

Indexed keywords

CRYSTAL GROWTH; ELECTRIC CONDUCTIVITY; ENERGY GAP; EXCITONS; OPTICAL PROPERTIES; SEMICONDUCTOR MATERIALS; SINGLE CRYSTALS;

BOSE-EINSTEIN EQUATION; CHEMICAL VAPOR TRANSPORT METHOD; PIEZOREFLECTANCE MEASUREMENTS; VARSHNI EQUATION;

RHENIUM COMPOUNDS;

EID: 0031188913     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(97)00135-X     Document Type: Article

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