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Volumn 61, Issue 20, 2000, Pages 13821-13832
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Electrostatic screening near semiconductor surfaces
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 4243954565
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.61.13821 Document Type: Article |
Times cited : (22)
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References (14)
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