|
Volumn 92, Issue 2, 2002, Pages 1009-1013
|
Thickness and angular dependencies of exchange bias in ferromagnetic/ antiferromagnetic bilayers
a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
AFM;
ANGULAR DEPENDENCIES;
ANGULAR VARIATION;
ANTIFERROMAGNETIC LAYERS;
ANTIFERROMAGNETICS;
APPLIED FIELD;
BI-LAYER;
CRITICAL THICKNESS;
EASY AXIS;
EXCHANGE BIAS;
EXCHANGE COUPLING CONSTANTS;
EXPLICIT FORMULA;
SATURATION VALUES;
SPIN FLOPS;
ANTIFERROMAGNETIC MATERIALS;
EXCHANGE COUPLING;
ANTIFERROMAGNETISM;
|
EID: 0037101052
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1486020 Document Type: Article |
Times cited : (23)
|
References (24)
|