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Volumn 92, Issue 2, 2002, Pages 1009-1013

Thickness and angular dependencies of exchange bias in ferromagnetic/ antiferromagnetic bilayers

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ANGULAR DEPENDENCIES; ANGULAR VARIATION; ANTIFERROMAGNETIC LAYERS; ANTIFERROMAGNETICS; APPLIED FIELD; BI-LAYER; CRITICAL THICKNESS; EASY AXIS; EXCHANGE BIAS; EXCHANGE COUPLING CONSTANTS; EXPLICIT FORMULA; SATURATION VALUES; SPIN FLOPS;

EID: 0037101052     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1486020     Document Type: Article
Times cited : (23)

References (24)
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    • Scott, J.C.1
  • 12
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    • prl PRLTAO 0031-9007
    • N. C. Koon, Phys. Rev. Lett. 78, 4865 (1997). prl PRLTAO 0031-9007
    • (1997) Phys. Rev. Lett. , vol.78 , pp. 4865
    • Koon, N.C.1
  • 13
    • 4243669018 scopus 로고
    • prl PRLTAO 0031-9007
    • J. Slonczewski, Phys. Rev. Lett. 67, 3172 (1991). prl PRLTAO 0031-9007
    • (1991) Phys. Rev. Lett. , vol.67 , pp. 3172
    • Slonczewski, J.1
  • 19
    • 84861441238 scopus 로고    scopus 로고
    • prb PRBMDO 0163-1829
    • 61, 1318 (2000). prb PRBMDO 0163-1829
    • (2000) , vol.61 , pp. 1318


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.