Antiferromagnetic thickness dependence of exchange biasing

Physical Review B - Condensed Matter and Materials Physics

Volumn 61, Issue 1, 2000, Pages 80-83

  Xi, Haiwen ^a   White, Robert M ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002659189     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.80     Document Type: Article

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