Raman scattering as a probe of morphology in conjugated polymer thin films

Journal of Applied Physics

Volumn 92, Issue 2, 2002, Pages 1154-1161

  Liem, H ^a   Etchegoin, P ^a   Whitehead, K S ^a   Bradley, D D C ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR DEPENDENCE; CONFOCAL RAMAN; CONJUGATED POLYMER THIN FILMS; DIFFRACTION LIMITED SPATIAL RESOLUTION; IN-SITU CHARACTERIZATION; MICROSCOPE OPTICS; ORIENTED SAMPLE; POLARIZED RAMAN; POLYMER OPTOELECTRONICS; RAMAN ACTIVE MODES; SELECTION RULES; SENSITIVE PROBE; TEMPERATURE DEPENDENT RAMAN SCATTERING; THERMAL PHASE TRANSITION;

OPTOELECTRONIC DEVICES; RAMAN SCATTERING; RAMAN SPECTROSCOPY;

PROBES;

EID: 0037100875     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1468251     Document Type: Article

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