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Volumn 65, Issue 23, 2002, Pages 2354351-2354355
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Magnetic force microscopy study of perpendicular magnetization reorientation for Fe grown on Cu/Si(111)
a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
COPPER;
IRON;
SILICON;
ARTICLE;
CHEMICAL ANALYSIS;
FILM;
IMAGE ANALYSIS;
IMAGING;
MAGNETIC FORCE MICROSCOPY;
MAGNETISM;
MICROSCOPY;
SCANNING TUNNELING MICROSCOPY;
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EID: 0037096682
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevB.65.235435 Document Type: Article |
Times cited : (19)
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References (18)
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