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Surface Science

Volumn 482-485, Issue PART 2, 2001, Pages 916-921

Epitaxy of Fe/Cu/Si(1 1 1) ultrathin films: An Auger electron diffraction study

(6) Castrucci, P a Gunnella, R a Bernardini, R a Montecchiari, A a Carboni, R a De Crescenzi, M a

a UNIVERSITY OF CAMERINO (Italy)

Author keywords

Auger electron diffraction; Epitaxy; Growth; Low energy electron diffraction (LEED); Magnetic films

Indexed keywords

EID: 0001468997 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(01)00816-0 Document Type: Article

Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.