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Volumn 433, Issue , 1999, Pages 685-689
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Double magnetization reorientation in epitaxial Cu/Ni/Cu/Si(111) ultra-thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
ANISOTROPY;
BRILLOUIN SCATTERING;
ELECTROMAGNETIC WAVES;
EPITAXIAL GROWTH;
KERR MAGNETOOPTICAL EFFECT;
LOW ENERGY ELECTRON DIFFRACTION;
MAGNETIZATION;
METALLIC MATRIX COMPOSITES;
NICKEL;
SEMICONDUCTING SILICON;
SINGLE CRYSTALS;
SURFACE STRUCTURE;
DOUBLE MAGNETIZATION REORIENTATION;
DOUBLE ORIENTATION TRANSITION;
FILM THICKNESS;
MAGNETIC STRUCTURES;
MAGNETOSTATIC ENERGY;
ULTRATHIN FILMS;
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EID: 0033343586
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(99)00156-9 Document Type: Article |
Times cited : (17)
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References (10)
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