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International Journal of Mass Spectrometry

Volumn 216, Issue 3, 2002, Pages 269-284

Measurement of external ion injection and trapping efficiency in the ion trap mass spectrometer and comparison with a predictive model

(2) Appelhans, A D a Dahl, D A a

a IDAHO NATIONAL LABORATORY (United States)

Author keywords

Ion injection; Quadrupole ion trap; Secondary ion mass spectrometry (SIMS); SIMION; Simulation

Indexed keywords

BUFFER; CESIUM; HELIUM; ION;

ARTICLE; DEVICE; ENERGY; FLOW INJECTION ANALYSIS; GAS; GAS ANALYSIS; ION CURRENT; MASS SPECTROMETER; MASS SPECTROMETRY; MODEL; PREDICTION; PRESSURE; PROBABILITY; SIMULATION;

EID: 0037095031 PISSN: 13873806 EISSN: None Source Type: Journal
DOI: 10.1016/S1387-3806(02)00627-9 Document Type: Article

Times cited : (43)

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