Simulation of external ion injection, cooling and extraction processes with SIMION 6.0 for the ion trap/reflectron time-of-flight mass spectrometer

Rapid Communications in Mass Spectrometry

Volumn 11, Issue 13, 1997, Pages 1467-1477

  He, Ling ^a   Lubman, David M ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXTRACTION; FLIGHT SIMULATORS; KINETIC ENERGY; KINETICS; MASS SPECTROMETERS;

COOLING PROCESS; EXTRACTION PROCESS; INJECTION PROCESS; ION COOLING; ION EXTRACTION; ION INJECTION; ION TRAPS; PC-BASED; REFLECTRONS; TIME-OF-FLIGHT MASS SPECTROMETERS;

IONS;

EID: 0030885207     PISSN: 09514198     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0231(19970830)11:13<1467::AID-RCM54>3.0.CO;2-X     Document Type: Article

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