A modular ion beam deflector

International Journal of Mass Spectrometry

Volumn 189, Issue 1, 1999, Pages 47-51

  Dahl, David A ^a   Appelhans, Anthony D ^a   Ward, Michael B ^a  

^a IDAHO NATIONAL LABORATORY   (United States)

Author keywords

Ion optics; Ion trap; Secondary ion mass spectrometry

Indexed keywords

EID: 0009527652     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1387-3806(99)00051-2     Document Type: Article

References (3)

1. A. Benninghoven, R.G. Rudenauer, H.W. Werner, in Secondary Ion Mass Spectrometry Basic Concepts, Instrumental Aspects, Applications and Trends, Wiley, New York, 1987, p. 338.
2. D.A. Dahl, SIMION 3D Version 6.0 User's Manual, INEL-95/ 0403 (1995).
3. D.A. Dahl, A.D. Appelhans, M.B. Ward, Int. J. Mass Spectrom. 189 (1999) 39-46.