Magnetic force microscopy observations of the magnetic behavior in Co-C nanodot arrays

Journal of Applied Physics

Volumn 91, Issue 10 I, 2002, Pages 7311-7313

  Gao, L ^a   Liou, S H ^a   Zheng, M ^a   Skomski, R ^a   Yan, M L ^a   Sellmyer, D J ^a   Polushkin, N I ^b  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^b INSTITUTE FOR PHYSICS OF MICROSTRUCTURES   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EASY AXIS; GRADIENT FORCE; LOCAL DEFECTS; MAGNETIC BEHAVIOR; NANO-DOT ARRAYS; REMANENT MAGNETIZATION; SATURATED MAGNETIZATION;

DEFECTS; NANOSTRUCTURED MATERIALS;

MAGNETIC FORCE MICROSCOPY;

EID: 0037094770     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1452259     Document Type: Article

References (11)

1. B. D. Terris, L. Folks, D. Weller, J. E. E. Baglin, A. J. Kellock, H. Rothuizen, and P. Vettiger, Appl. Phys. Lett. 75, 403 (1999). apl APPLAB 0003-6951
2. S. Y. Chou, M. Wei, P. R. Krauss, and P. B. Fisher, J. Vac. Sci. Technol. B 12, 3695 (1994). jvb JVTBD9 0734-211X
3. T. A. Savas, M. Farhoud, H. I. Smith, M. Hwang, and C. A. Ross, J. Appl. Phys. 85, 6160 (1999). jap JAPIAU 0021-8979
4. A. Fernandez, P. J. Bedrossian, S. L. Baker, S. P. Vernon, and D. R. Kania, IEEE Trans. Magn. 32, 4472 (1996). emg IEMGAQ 0018-9464
5. M. Zheng et al., Appl. Phys. Lett. 79, 2606 (2001). apl APPLAB 0003-6951
6. M. Zheng et al., IEEE Trans. Magn. 7, 2070 (2001). emg IEMGAQ 0018-9464
7. M. Yu, Y. Liu, and D. J. Sellmyer, J. Appl. Phys. 85, 4319 (1999). jap JAPIAU 0021-8979
8. T. J. Konno and R. Sinclair, Acta Metall. Mater. 42, 1231 (1994). amm AMATEB 0956-7151
9. T. Hayashi, S. Hirono, M. Tomita, and S. Umemura, Nature (London) 381, 772 (1996). nat NATUAS 0028-0836
10. J.-J. Delaunay, T. Hayashi, M. Tomita, and S. Hirono, J. Appl. Phys. 82, 2200 (1997). jap JAPIAU 0021-8979
11. S. H. Liou and Y. D. Yao, J. Magn. Magn. Mater. 190, 130 (1998). jmm JMMMDC 0304-8853