SCOPUS 정보 검색 플랫폼

Volumn 74, Issue 10, 2002, Pages 2361-2369

Quantitative depth profile analysis of micrometer-thick multilayered thin coatings using step-scan FT-IR photoacoustic spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

DEPTH PROFILE ANALYSIS; THIN COATINGS;

FOURIER TRANSFORM INFRARED SPECTROSCOPY; MICROMETERS; MICROSCOPIC EXAMINATION; PHOTOACOUSTIC SPECTROSCOPY;

MULTILAYERS;

ANALYTIC METHOD; ARTICLE; COMPARATIVE STUDY; INFRARED SPECTROSCOPY; MEASUREMENT; MICROSCOPY; MICROTOMY; PHOTOACOUSTIC SPECTROSCOPY; THICKNESS;

EID: 0037092998 PISSN: 00032700 EISSN: None Source Type: Journal
DOI: 10.1021/ac011027j Document Type: Article

Times cited : (17)

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