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Volumn 51, Issue 8, 1997, Pages 1238-1244

Phase-resolved depth profiling of thin-layered plasma polymer films by step-scan Fourier transform infrared photoacoustic spectroscopy

Author keywords

Depth profiling; Phase resolved spectroscopy; Photoacoustic spectroscopy (PAS); Plasma polymers; Step scan FT IR

Indexed keywords

FOURIER TRANSFORM INFRARED SPECTROSCOPY; PHOTOACOUSTIC SPECTROSCOPY; PLASMAS; THIN FILMS;

EID: 0031206769     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702971941818     Document Type: Article
Times cited : (35)

References (29)
  • 13
    • 8544247489 scopus 로고
    • Ph.D. Dissertation, Duke University, Durham, North Carolina
    • R. M. Dittmar, Ph.D. Dissertation, Duke University, Durham, North Carolina (1992).
    • (1992)
    • Dittmar, R.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.