FT-IR PAS: A versatile tool for spectral depth profiling chemical analysis

Spectroscopy (Santa Monica)

Volumn 13, Issue 2, 1998, Pages 21-40

  Jiang, Eric Y ^a   McCarthy, William J ^a   Drapcho, David L ^a  

^a BIO RAD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002849263     PISSN: 08876703     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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