Current and voltage noise in WO3 nanoparticle films

Journal of Applied Physics

Volumn 91, Issue 8, 2002, Pages 5221-5226

  Hoel, A ^a   Vandamme, L K J ^a   Kish, L B ^a   Olsson, E ^a  

^a UPPSALA UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EQUILIBRIUM PHENOMENA; FLUCTUATION DISSIPATION THEOREM; INSULATING FILM; NANOCRYSTALLINES; NANOPARTICLE FILMS; NOISE MEASUREMENTS; QUALITY ASSESSMENT; VOLTAGE NOISE;

PHYSICAL PROPERTIES; PHYSICS;

ACOUSTIC NOISE MEASUREMENT;

EID: 0037091702     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1423398     Document Type: Article

References (17)

1. C. G. Granqvist, Handbook of Inorganic Electrochromic Materials (Elsevier, Amsterdam, 1995).
2. J. Tamaki, Z. Zhang, K. Fujimori, M. Akiyama, T. Harada, N. Miura, and N. Yamazoe, J. Electrochem. Soc. 141, 2207 (1994). jes JESOAN 0013-4651
3. L. K. J. Vandamme, IEEE Trans. Electron Devices 41, 2176 (1994). etd IETDAI 0018-9383
4. C. G. Granqvist and R. A. Buhrman, J. Appl. Phys. 47, 2200 (1976). jap JAPIAU 0021-8979
5. C. Hayashi, R. Uyeda, and A. Tasaki, Ultra-Fine Particles (Noyes, Westwood, 1997).
6. R. W. Siegel, Annu. Rev. Mater. Sci. 21, 559 (1991). arm ARMSCX 0084-6600
7. H. Gleiter, Nanostruct. Mater. 1, 1 (1992). nsm NMAEE7 0965-9773
8. J. L. Solis, A. Hoel, L. B. Kish, and C. G. Grandquist, J. Am Ceram. Soc. 84, 1504 (2001). jac JACTAW 0002-7820
9. A. Hoel, L. B. Kish, R. Vajtai, G. A. Niklasson, C. G. Grandquist, and E. Olsson, Mater. Res. Soc. Symp. Proc. 581, 15 (2000). mrs MRSPDH 0272-9172
10. A. Hoel, L. B. Kish, R. Vajtai, and E. Olsson, Proceedings of the 51st Annual Meeting Scandinavian Society Electron Microscopy, Bergen, Norway, 1999, p. 51.
11. J. Söderlund, L. B. Kiss, G. A. Niklasson, and C. G. Granqvist, Phys. Rev. Lett. 80, 2386 (1998). prl PRLTAO 0031-9007
12. F. N. Hooge, T. G. M. Kleinpenning, and L. K. J. Vandamme, Rep. Prog. Phys. 44, 479 (1981). rpp RPPHAG 0034-4885
13. T. E. Price and L. A. Berthoud, Solid-State Electron. 16, 1303 (1973). sel SSELA5 0038-1101
14. F. N. Hooge, Phys. Lett. 29A, 139 (1969). pya PYLAAG 0375-9601
15. D. M. Fleetwood, J. T. Masden, and N. Giordano, Phys. Rev. Lett. 50, 450 (1983). prl PRLTAO 0031-9007
16. E. P. Vandamme and L. K. J. Vandamme, Microelectron. Reliab. 40, 1847 (2000). mcr MCRLAS 0026-2714
17. F. Green and M. P. Das, AIP Conf. Proc. 511, 422 (2000). apc APCPCS 0094-243X