Self-assembly of Si and SiOx nanostructures

Journal of Materials Science Letters

Volumn 21, Issue 2, 2002, Pages 175-177

  Chen, Y J ^a   Li, J B ^a   Han, Y S ^a   Dai, J H ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY DISPERSIVE SPECTROSCOPY; EVAPORATION; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SELF ASSEMBLY; SILICON; THERMOANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

THERMAL EVAPORATION;

NANOSTRUCTURED MATERIALS;

EID: 0037081918     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1014261602564     Document Type: Article

References (12)