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Volumn 65, Issue 4, 2002, Pages 453131-453137

Measurements of noise caused by switching of impurity states and of suppression of shot noise in surface-acoustic-wave-based single-electron pumps

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTICS; ANALYTICAL ERROR; ARTICLE; ELECTRON; MATHEMATICAL MODEL; MEASUREMENT; QUANTUM MECHANICS; SIGNAL NOISE RATIO; STRUCTURE ANALYSIS;

EID: 0037081361     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (34)

References (23)
  • 21
    • 33744576951 scopus 로고    scopus 로고
    • NF Corporation, Yokohama, Japan


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.