A noise detection scheme with 10 mK noise temperature resolution for semiconductor single electron tunneling devices

Journal of Applied Physics

Volumn 81, Issue 11, 1997, Pages 7350-7356

  Glattli, D C ^a   Jacques, P ^a   Kumar, A ^a   Pari, P ^a   Saminadayar, L ^a  

^a SERVICE DE PHYSIQUE DE L ETAT CONDENSÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); ATTENUATION; ELECTRON TUNNELING; PHOTONS; REFRIGERATORS; SIGNAL FILTERING AND PREDICTION; SIGNAL NOISE MEASUREMENT; SPECTRUM ANALYSIS; TEMPERATURE MEASUREMENT;

CRYOGENIC COAXES; ELECTRON PHONON COUPLING; ELECTRON TEMPERATURE; ELECTRON TRAPS; LOW FREQUENCY NOISE; SINGLE ELECTRON TUNNELING DEVICES; TELEGRAPHIC NOISE; THERMALIZATION;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0031167890     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365332     Document Type: Article

References (22)

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