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Volumn 149, Issue 2-3, 2002, Pages 217-223

Characterisation and performance of partially filtered arc TiAlN coatings

Author keywords

Physical vapour deposited (PVD)coatings; Residual stress; Thin film PVD coatings

Indexed keywords

CHARACTERIZATION; PHYSICAL VAPOR DEPOSITION; RESIDUAL STRESSES; THIN FILMS; TITANIUM; X RAY DIFFRACTION;

EID: 0037080703     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(01)01448-7     Document Type: Article
Times cited : (66)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.