Segregation of lead in oxide film of high-purity aluminum containing 100 ppm lead

Applied Surface Science

Volumn 185, Issue 3-4, 2002, Pages 298-302

  Tsubakino, H ^a   Nogami, A ^a   Yamanoi, T ^b  

^a UNIVERSITY OF HYOGO   (Japan)

^b Showa Denko Materials Co   (Japan)

Author keywords

Al Pb; EDX; Oxide film; Segregation; TEM

Indexed keywords

ALUMINUM FOIL; AMORPHOUS FILMS; ANNEALING; ENERGY DISPERSIVE SPECTROSCOPY; LEAD; SEGREGATION (METALLOGRAPHY); TRANSMISSION ELECTRON MICROSCOPY;

OXIDE FILMS;

SURFACE PHENOMENA;

EID: 0037080380     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00987-4     Document Type: Article

References (9)