The effect of lead impurity on the DC-etching behaviour of aluminum foil for electrolytic capacitor usage

Corrosion Science

Volumn 38, Issue 6, 1996, Pages 889-907

  Lin, W ^a   Tu, G C ^a   Lin, C F ^b   Peng, Y M ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM FOIL; ELECTROLYTIC CAPACITORS; ETCHING; IMPURITIES; LEAD COMPOUNDS; MORPHOLOGY;

DC ETCHING BEHAVIOUR; ETCHING MECHANISM; IMMERSION REDUCTION REACTION; LEAD FOIL; ROLLING LINES; UNIFORMLY DISTRIBUTED VERTICAL TUNNEL ETCHINGS;

LEAD;

EID: 0030170333     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0010-938X(96)00175-8     Document Type: Article

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