Microstructural and atomic arrangement studies in Fe (110)/GaAs (110) heterostructures

Journal of Physics and Chemistry of Solids

Volumn 61, Issue 6, 2000, Pages 847-851

  Kim, T W ^a   Yoon, Y S ^b  

^a Kwangwoon University   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; CRYSTAL ATOMIC STRUCTURE; CRYSTAL MICROSTRUCTURE; EPITAXIAL GROWTH; IRON; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR SUPERLATTICES; SURFACE ROUGHNESS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

ATOMIC ARRANGEMENT; INTERDIFFUSION; ION BEAM ASSISTED DEPOSITION;

HETEROJUNCTIONS;

EID: 0033906651     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3697(99)00398-4     Document Type: Article

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