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Journal of Physics Condensed Matter

Volumn 14, Issue 5, 2002, Pages 967-973

Evolution of Raman spectra as a function of layer thickness in ultra-thin InSe films

(5) Schwarcz, R a Kanehisa, M A a Jouanne, M a Morhange, J F a Eddrief, M b

a SORBONNE UNIVERSITÉ (France)

b UNIVERSITÉ PIERRE ET MARIE CURIE (France)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT LIGHT; FILM GROWTH; HETEROJUNCTIONS; MATHEMATICAL MODELS; MOLECULAR BEAM EPITAXY; RAMAN SPECTROSCOPY; SEMICONDUCTING INDIUM COMPOUNDS; SPECTRUM ANALYSIS; VAN DER WAALS FORCES;

INDIUM SELENIDE; LAYER THICKNESS; LINEAR CHAIN MODEL; VAN DER WAALS EPITAXY;

ULTRATHIN FILMS;

EID: 0037060421 PISSN: 09538984 EISSN: None Source Type: Journal
DOI: 10.1088/0953-8984/14/5/302 Document Type: Article

Times cited : (15)

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