SCOPUS 정보 검색 플랫폼

Volumn , Issue 181-182, 2000, Pages 221-224

Surface relaxation of ZnO single crystal (0001) surface

(5) Maki, Hideyuki a Ichinose, Noboru a Ohashi, Naoki b Haneda, Hajime c Tanaka, Junzo c

c NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

Author keywords

Atomic Force Microscopy; Coaxial Impact Collision Ion Scattering Spectroscopy; Reflection High Energy Electron Diffraction; Surface Relaxation; Zinc Oxide

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; CRYSTAL IMPURITIES; HEATING; IRRADIATION; LATTICE CONSTANTS; PRESSURE EFFECTS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; RELAXATION PROCESSES; SINGLE CRYSTALS; SPECTROSCOPIC ANALYSIS; SURFACE STRUCTURE;

COAXIAL IMPACT COLLISION ION SCATTERING SPECTROSCOPY; SURFACE RELAXATION;

ZINC OXIDE;

EID: 0033717653 PISSN: 10139826 EISSN: 16629795 Source Type: Book Series
DOI: None Document Type: Article

Times cited : (3)

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