-
2
-
-
0033807301
-
-
Hamers R.J., Coulter S.K., Ellison M.D., Hovis J.S., Padowitz D.F., Schwartz M.P., Greenlief C.M., Russell J.N. Jr. Acc. Chem. Res. 33:2000;617.
-
(2000)
Acc. Chem. Res.
, vol.33
, pp. 617
-
-
Hamers, R.J.1
Coulter, S.K.2
Ellison, M.D.3
Hovis, J.S.4
Padowitz, D.F.5
Schwartz, M.P.6
Greenlief, C.M.7
Russell J.N., Jr.8
-
3
-
-
0037076133
-
-
Cai W., Lin Z., Strother T., Smith L.M., Hamers R.J. J. Phys. Chem. B. 106:2002;2656.
-
(2002)
J. Phys. Chem. B
, vol.106
, pp. 2656
-
-
Cai, W.1
Lin, Z.2
Strother, T.3
Smith, L.M.4
Hamers, R.J.5
-
4
-
-
0036180508
-
-
Ashkenasy G., Cahen D., Cohen R., Shanzer A., Vilan A. Acc. Chem. Res. 35:2002;121.
-
(2002)
Acc. Chem. Res.
, vol.35
, pp. 121
-
-
Ashkenasy, G.1
Cahen, D.2
Cohen, R.3
Shanzer, A.4
Vilan, A.5
-
8
-
-
0034298187
-
-
Othmen K., Boule P., Szczepanik B., Rotkiewicz K., Grabner G. J. Phys. Chem. A. 104:2000;9525.
-
(2000)
J. Phys. Chem. A
, vol.104
, pp. 9525
-
-
Othmen, K.1
Boule, P.2
Szczepanik, B.3
Rotkiewicz, K.4
Grabner, G.5
-
9
-
-
0035929393
-
-
Guizzardi B., Mella M., Fagnoni M., Freccero M., Albini A. J. Org. Chem. 66:2001;6353.
-
(2001)
J. Org. Chem.
, vol.66
, pp. 6353
-
-
Guizzardi, B.1
Mella, M.2
Fagnoni, M.3
Freccero, M.4
Albini, A.5
-
10
-
-
0035929426
-
-
Mella M., Coppo P., Guizzardi B., Fagnoni M., Freccero M., Albini A. J. Org. Chem. 66:2001;6344.
-
(2001)
J. Org. Chem.
, vol.66
, pp. 6344
-
-
Mella, M.1
Coppo, P.2
Guizzardi, B.3
Fagnoni, M.4
Freccero, M.5
Albini, A.6
-
13
-
-
0011022008
-
-
Department of Organic Chemistry, University of Pavia, private communication
-
A. Albini, Department of Organic Chemistry, University of Pavia, private communication.
-
-
-
Albini, A.1
-
19
-
-
0004279241
-
-
Oriel Corp., Stratford, CT, USA
-
The Book of Photon Tools, Oriel Corp., Stratford, CT, USA (1999).
-
(1999)
The Book of Photon Tools
-
-
-
26
-
-
0004133516
-
-
Gaussian, Inc., Pittsburgh, PA
-
Gaussian98 (Revision A.11), M.J. Frisch, G.W. Trucks, H.B. Schlegel, G.E. Scuseria, M.A. Robb, J.R. Cheeseman, V.G. Zakrzewski, J.A. Montgomery Jr., R.E. Stratmann, J.C. Burant, S. Dapprich, J.M. Millam, A.D. Daniels, K.N. Kudin, M.C. Strain, O. Farkas, J. Tomasi, V. Barone, M. Cossi, R. Cammi, B. Mennucci, C. Pomelli, C. Adamo, S. Clifford, J. Ochterski, G.A. Petersson, P.Y. Ayala, Q. Cui, K. Morokuma, P. Salvador, J.J. Dannenberg, D.K. Malick, A.D. Rabuck, K. Raghavachari, J.B. Foresman, J. Cioslowski, J.V. Ortiz, A.G. Baboul, B.B. Stefanov, G. Liu, A. Liashenko, P. Piskorz, I. Komaromi, R. Gomperts, R.L. Martin, D.J. Fox, T. Keith, M.A. Al-Laham, C.Y. Peng, A. Nanayakkara, M. Challacombe, P.M.W. Gill, B. Johnson, W. Chen, M.W. Wong, J.L. Andres, C. Gonzalez, M. Head-Gordon, E.S. Replogle, J.A. Pople, Gaussian, Inc., Pittsburgh, PA, 2001.
-
(2001)
Gaussian98 (Revision A.11)
-
-
Frisch, M.J.1
Trucks, G.W.2
Schlegel, H.B.3
Scuseria, G.E.4
Robb, M.A.5
Cheeseman, J.R.6
Zakrzewski, V.G.7
Montgomery J.A., Jr.8
Stratmann, R.E.9
Burant, J.C.10
Dapprich, S.11
Millam, J.M.12
Daniels, A.D.13
Kudin, K.N.14
Strain, M.C.15
Farkas, O.16
Tomasi, J.17
Barone, V.18
Cossi, M.19
Cammi, R.20
Mennucci, B.21
Pomelli, C.22
Adamo, C.23
Clifford, S.24
Ochterski, J.25
Petersson, G.A.26
Ayala, P.Y.27
Cui, Q.28
Morokuma, K.29
Salvador, P.30
Dannenberg, J.J.31
Malick, D.K.32
Rabuck, A.D.33
Raghavachari, K.34
Foresman, J.B.35
Cioslowski, J.36
Ortiz, J.V.37
Baboul, A.G.38
Stefanov, B.B.39
Liu, G.40
Liashenko, A.41
Piskorz, P.42
Komaromi, I.43
Gomperts, R.44
Martin, R.L.45
Fox, D.J.46
Keith, T.47
Al-Laham, M.A.48
Peng, C.Y.49
Nanayakkara, A.50
Challacombe, M.51
Gill, P.M.W.52
Johnson, B.53
Chen, W.54
Wong, M.W.55
Andres, J.L.56
Gonzalez, C.57
Head-Gordon, M.58
Replogle, E.S.59
Pople, J.A.60
more..
-
30
-
-
0035975473
-
-
Check C.E., Faust T.O., Bailey J.M., Wright B.J., Gilbert T.M., Sunderlin L.S. J. Phys. Chem. A. 105:2001;8111.
-
(2001)
J. Phys. Chem. A
, vol.105
, pp. 8111
-
-
Check, C.E.1
Faust, T.O.2
Bailey, J.M.3
Wright, B.J.4
Gilbert, T.M.5
Sunderlin, L.S.6
-
40
-
-
0004225279
-
NIST electron effective-attenuation-length database
-
US National Institute of Standards and Technology, Gaithersburg, MD
-
C.J. Powell, A. Jablonski, NIST Electron Effective-Attenuation-Length Database (NIST Standard Reference Database 82), US National Institute of Standards and Technology, Gaithersburg, MD, 2001.
-
(2001)
NIST Standard Reference Database
, vol.82
-
-
Powell, C.J.1
Jablonski, A.2
-
41
-
-
0036025403
-
-
Rienstra-Kiracofe J.C., Tschumper G.S., Schaefer H.F. III, Nandi S., Ellison G.B. Chem. Rev. 102:2002;231.
-
(2002)
Chem. Rev.
, vol.102
, pp. 231
-
-
Rienstra-Kiracofe, J.C.1
Tschumper, G.S.2
Schaefer H.F. III3
Nandi, S.4
Ellison, G.B.5
-
44
-
-
0000076750
-
-
Camillone N. III, Khan K.A., Lasky P.J., Wu L., Moryl J.E., Osgood R.M. Jr. J. Chem. Phys. 109:1998;8045.
-
(1998)
J. Chem. Phys.
, vol.109
, pp. 8045
-
-
Camillone N. III1
Khan, K.A.2
Lasky, P.J.3
Wu, L.4
Moryl, J.E.5
Osgood R.M., Jr.6
-
45
-
-
0011056551
-
-
Varekamp P.R., Simpson W.C., Shuh D.K., Durbin T.D., Chakarian V., Yarmoff J.A. Phys. Rev. B. 50:1994;14267.
-
(1994)
Phys. Rev. B
, vol.50
, pp. 14267
-
-
Varekamp, P.R.1
Simpson, W.C.2
Shuh, D.K.3
Durbin, T.D.4
Chakarian, V.5
Yarmoff, J.A.6
|