Experiments on the relation between GMR and interface roughness and on the interlayer exchange coupling across semiconductors

Journal of Physics D: Applied Physics

Volumn 35, Issue 19, 2002, Pages 2403-2409

  Grunberg P ^a   Burgler D E ^a   Gareev, R ^a   Olligs, D ^a   Buchmeier, M ^a   Breidbach, M ^a   Kuanr, B ^a   Schreiber, R ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BRILLOUIN SCATTERING; GIANT MAGNETORESISTANCE; INTERFACES (MATERIALS); SURFACE ROUGHNESS;

CURRENT PERPENDICULAR PLANE; INTERLAYER EXCHANGE COUPLING; MICROSCOPIC MECHANISM;

SEMICONDUCTOR MATERIALS;

EID: 0037038154     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/35/19/312     Document Type: Article

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