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Solid State Communications

Volumn 121, Issue 9-10, 2002, Pages 555-559

Precise measurement of equation-of-state and elastic properties for GaN up to 16 GPa

(5) Tsuchiya, T a Kawamura, K a Ohtaka, O b Fukui, H b Kikegawa, T c

a TOKYO INSTITUTE OF TECHNOLOGY (Japan)

b OSAKA UNIVERSITY (Japan)

c HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK (Japan)

Author keywords

A. GaN; C. X ray scattering; D. Equation of state

Indexed keywords

ANNEALING; ELASTIC MODULI; EQUATIONS OF STATE; HYDROSTATIC PRESSURE; NITRIDES; SPECTROSCOPIC ANALYSIS; X RAY DIFFRACTION; X RAY SCATTERING;

QUASIHYDROSTATIC COMPRESSION;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0037034749 PISSN: 00381098 EISSN: None Source Type: Journal
DOI: 10.1016/S0038-1098(01)00492-6 Document Type: Article

Times cited : (18)

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