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Volumn 90, Issue 1-2, 2002, Pages 90-98

Studies on structural and electrical properties of silicon nitride films deposited by unbalanced magnetron sputter deposition

Author keywords

Ion assisted growth; Silicon nitride films; Unbalanced magnetron sputtering

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; ION BOMBARDMENT; MAGNETRON SPUTTERING; MIM DEVICES; MISFET DEVICES; PERMITTIVITY MEASUREMENT; SILICON NITRIDE; SPUTTER DEPOSITION;

EID: 0037034715     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(01)00916-3     Document Type: Article
Times cited : (12)

References (43)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.