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Volumn 90, Issue 1-2, 2002, Pages 90-98
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Studies on structural and electrical properties of silicon nitride films deposited by unbalanced magnetron sputter deposition
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Author keywords
Ion assisted growth; Silicon nitride films; Unbalanced magnetron sputtering
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
AUGER ELECTRON SPECTROSCOPY;
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC CONDUCTIVITY;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
ION BOMBARDMENT;
MAGNETRON SPUTTERING;
MIM DEVICES;
MISFET DEVICES;
PERMITTIVITY MEASUREMENT;
SILICON NITRIDE;
SPUTTER DEPOSITION;
DIELECTRIC STRENGTH;
THIN FILMS;
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EID: 0037034715
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5107(01)00916-3 Document Type: Article |
Times cited : (12)
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References (43)
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