Grazing-incidence X-ray reflectivity on nanosized vanadium oxide and V/Ce oxide films

Materials Science and Engineering: B

Volumn 90, Issue 1-2, 2002, Pages 154-162

  Posedel, D ^a   Turkovic A ^a   Dubcek P ^a,b   Crnjak Orel, Z ^c  

^a RUDER BO KOVI INSTITUTE   (Croatia)

^b SINCROTRONE TRIESTE   (Italy)

^c NATIONAL INSTITUTE OF CHEMISTRY   (Slovenia)

Author keywords

Dip coating; Grazing incidence small angle X ray scattering; Grazing incidence X ray reflectivity; Thin films; V Ce oxide

Indexed keywords

GRAIN SIZE AND SHAPE; METALLIC FILMS; NANOSTRUCTURED MATERIALS; SOL-GELS; SUBSTRATES; X RAY SCATTERING;

VANADIUM OXIDES;

VANADIUM COMPOUNDS;

EID: 0037034676     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(01)00933-3     Document Type: Article

References (18)

1. Grazing-incidence small-angle X-ray scattering on nanosized vanadium oxide and V/Ce oxide films
2. Small angle X-ray scattering-beamline at ELETTRA: A new powerful station for structural investigations with synchrotron radiation
3. Small angle X-ray scattering and X-ray reflection on thin films