Structural Parameters of Multilayers as Deduced from X-ray Specular Reflectivity: Effect of Statistical Thickness Fluctuations

Journal of Applied Crystallography

Volumn 29 PART 6, Issue , 1996, Pages 632-637

  Manciu, M ^a,b   Kordos, P ^a   Hartdegen, H ^a   Manaila, R ^b  

^a Inst F Schicht und Ionentechnik   (Germany)

^b NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008176624     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/s0021889896006358     Document Type: Article

References (9)

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