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Volumn 106, Issue 13, 2002, Pages 3394-3401

Characterization of titania loaded V-, Fe-, and Cr-incorporated MCM-41 by XRD, TPR, UV-vis, Raman, and XPS techniques

Author keywords

[No Author keywords available]

Indexed keywords

PHOTOCATALYSTS;

EID: 0037018563     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0138983     Document Type: Article
Times cited : (135)

References (44)
  • 6
    • 0011164844 scopus 로고    scopus 로고
    • U.S. Patent 5,232,580, 1993
    • Le, O.N.; Thomson, R.T. U.S. Patent 5,232,580, 1993.
    • Le, O.N.1    Thomson, R.T.2
  • 44
    • 0000503141 scopus 로고
    • Auger and x-ray photoelectron spectroscopy
    • Wiley: New York
    • Briggs, D.; Sea, M.P., Eds.; Auger and X-ray Photoelectron Spectroscopy. Practical Surface Analysis, 2nd ed.; Wiley: New York, 1990; Vol. 1.
    • (1990) Practical Surface Analysis, 2nd ed. , vol.1
    • Briggs, D.1    Sea, M.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.