Stoichiometry and adhesion

Physical Review B - Condensed Matter and Materials Physics

Volumn 61, Issue 24, 2000, Pages 16883-16889

  Zhang, W ^a   Smith, J ^b  

^a Princeton University   (United States)

^b DELPHI CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 14844354439     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.16883     Document Type: Article

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