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Electronics Letters

Volumn 38, Issue 1, 2002, Pages 55-57

Nonlocal impact ionisation coefficients derived from Monte Carlo calculations

(1) Marsland, J S a

a UNIVERSITY OF LIVERPOOL (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE DIODES; CALCULATIONS; CHARGE CARRIERS; ELECTRIC FIELDS; IMPACT IONIZATION; KINETIC ENERGY; MONTE CARLO METHODS; PROBABILITY DENSITY FUNCTION; SPURIOUS SIGNAL NOISE;

IONIZATION PATHLENGTH; NONLOCAL IONIZATION COEFFICIENT;

PHOTODIODES;

EID: 0037012067 PISSN: 00135194 EISSN: None Source Type: Journal
DOI: 10.1049/el:20020025 Document Type: Article

Times cited : (10)

References (6)

1
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- McIntyre, R.J.¹

2
- 0035247296
- Lucky drift model for nonlocal impact ionisation
- (2001) IEEE Proc., Optoelectron. , vol.148 , Issue.1 , pp. 81-83
- Jacob, B.¹ Plimmer, S.A.² Robson, P.N.³ Rees, G.J.⁴

3
- 35949036921
- Ionisation coefficients in semiconductors: A nonlocalised property
- (1974) Phys. Rev. Solid State B , vol.10 , Issue.10 , pp. 4284-4296
- Okuto, Y.¹ Crowell, C.R.²

4
- 0008080121
- Simulations of electron impact ionisation rate in GaAs in nonuniform electric fields
- (1986) J. Appl. Phys. , vol.60 , Issue.7 , pp. 2626-2629
- Kim, K.¹ Hess, K.²

5
- 0031120230
- Spatial limitations to the application of the lucky drift theory of impact ionisation
- (1997) IEEE Trans. Electron Devices , vol.44 , Issue.4 , pp. 659-663
- Plimmer, S.A.¹ David, J.P.R.² Dunn, G.M.³

6
- 0023250311
- A lucky drift model, including a soft threshold energy fitted to experimental measurements of ionisation coefficients
- (1987) Solid-State Electron. , vol.30 , Issue.1 , pp. 125-132
- Marsland, J.S.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.