Reliability of the minimal resistance path 1D approach for 2D and 3D nanometer-size disordered arrays

Materials Science and Engineering C

Volumn 19, Issue 1-2, 2002, Pages 171-174

  Leroy, Y ^a   Cordan, A S ^a   Goltzené, A ^a  

^a UNIVERSITÉ DE STRASBOURG   (France)

Author keywords

2D and 3D arrays; Coulomb blockade; Disorder; Monte Carlo simulator

Indexed keywords

METALLIC DOTS;

FIELD PROGRAMMABLE GATE ARRAYS; LATTICE CONSTANTS; MONTE CARLO METHODS;

NANOSTRUCTURED MATERIALS;

MICROELECTRONICS;

EID: 0037006024     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0928-4931(01)00478-7     Document Type: Article

References (14)