Measurement of the elastic constants of nanometer-thick films

Materials Science and Engineering C

Volumn 19, Issue 1-2, 2002, Pages 201-204

  Beghi, M G ^a   Bottani, C E ^a   Li Bassi, A ^a   Ossi, P M ^a   Tanner, B K ^b   Ferrari, A C ^c   Robertson, J ^c  

^a POLITECNICO DI MILANO   (Italy)

^b DURHAM UNIVERSITY   (United Kingdom)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Amorphous carbon; Brillouin scattering; Elastic constants; Surface acoustic waves; Thin films

Indexed keywords

ACOUSTIC WAVES; BRILLOUIN SCATTERING; NANOTECHNOLOGY; THICK FILMS; ULTRATHIN FILMS; X RAY ANALYSIS;

ELASTIC CONSTANTS;

MATERIALS SCIENCE;

ELASTIC PROPERTY; FILM; MEASUREMENT METHOD; NANOTECHNOLOGY;

EID: 0037005981     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0928-4931(01)00461-1     Document Type: Article

References (13)