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Volumn , Issue , 2002, Pages 207-209
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High temperature inductive switching of SIC GTO and diode
a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT DENSITY;
ELECTRIC BREAKDOWN;
ELECTRIC FIELDS;
HIGH TEMPERATURE OPERATIONS;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR DEVICE STRUCTURES;
SEMICONDUCTOR DIODES;
SEMICONDUCTOR SWITCHES;
SILICON CARBIDE;
FORWARD BLOCKING VOLTAGE;
HIGH TEMPERATURE INDUCTIVE SWITCHING;
REVERSE BLOCKING VOLTAGE;
SWITCHING DEVICE;
THYRISTORS;
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EID: 0036999167
PISSN: 10768467
EISSN: None
Source Type: Journal
DOI: 10.1109/MODSYM.2002.1189452 Document Type: Article |
Times cited : (1)
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References (8)
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