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Volumn 5, Issue 4-5 SPEC., 2002, Pages 321-331

A roadmap towards cost efficient 300 mm equipment

Author keywords

300 mm technology; Advanced process control; Processing costs

Indexed keywords

COST EFFECTIVENESS; PLASMA DEVICES; PROCESS CONTROL; SENSORS;

EID: 0036966742     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-8001(03)00010-6     Document Type: Conference Paper
Times cited : (4)

References (6)
  • 3
    • 0012850648 scopus 로고
    • Microelectronics manufacturing science and technology(MMST) (11 articles)
    • Doering B, editor. Microelectronics manufacturing science and technology(MMST) (11 articles). Texas Instr Tech J 1992;9(5):2-152.
    • (1992) Texas Instr Tech J , vol.9 , Issue.5 , pp. 2-152
    • Doering, B.1
  • 4
    • 0034839160 scopus 로고    scopus 로고
    • Integrated metrology: An enabler for advanced process control (APC)
    • Schneider C., Pfitzner L., Ryssel H. Integrated metrology. an enabler for advanced process control (APC) Proc SPIE. 4406:2001;118-130.
    • (2001) Proc SPIE , vol.4406 , pp. 118-130
    • Schneider, C.1    Pfitzner, L.2    Ryssel, H.3
  • 5
    • 0036076320 scopus 로고    scopus 로고
    • HandMon-ISPM: Handling monitoring in a loading station of a furnace
    • ASMC, Boston, USA, April 30-May 2
    • Trunk R., et al. HandMon-ISPM: handling monitoring in a loading station of a furnace. Advanced Semiconductor Manufacturing Conference, ASMC, Boston, USA, April 30-May 2, 2002. p. 113-8.
    • (2002) Advanced Semiconductor Manufacturing Conference , pp. 113-118
    • Trunk, R.1
  • 6
    • 0003389893 scopus 로고    scopus 로고
    • The challenge of a multi-component, multi-vendor clustertools
    • UCS/IEEE Bunkyo-ku, Tokyo, Japan
    • The challenge of a multi-component, multi-vendor clustertools. Proceedings of the ISSM'96, UCS/IEEE Bunkyo-ku, Tokyo, Japan, 1996. p. 54-7.
    • (1996) Proceedings of the ISSM'96 , pp. 54-57


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.