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Volumn , Issue , 2002, Pages 1234-1237

AMPS modeling of nanocrystalline SI P-layer in A-SI NIP solar cells

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ENERGY GAP; HYDROGEN; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; SILICON;

EID: 0036957819     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (14)

References (5)
  • 1
    • 0012580240 scopus 로고    scopus 로고
    • For AMPS
    • For AMPS, see http://www.psu.edu/dept/AMPS/.
  • 2
    • 0036531714 scopus 로고    scopus 로고
    • Study of a-SiGe:H films and n-i-p devices used in high efficiency triple junction solar cells
    • P. Agarwal, H. Povolny, S. Han and X. Deng, "Study of a-SiGe:H Films and n-i-p Devices used in High Efficiency Triple Junction Solar Cells", J. of Non-Cryst. Solids, 2002 pp. 1213-1218.
    • (2002) J. of Non-Cryst. Solids , pp. 1213-1218
    • Agarwal, P.1    Povolny, H.2    Han, S.3    Deng, X.4
  • 3
    • 0000375694 scopus 로고
    • Resonant tunneling via microcrystalline Si quantum confinement
    • Q. Ye, R. Tsu and E.H. Nicollian, "Resonant tunneling via microcrystalline Si quantum confinement", Phys. Rev. B 44, 1991, pp. 1806-1811.
    • (1991) Phys. Rev. , vol.44 B , pp. 1806-1811
    • Ye, Q.1    Tsu, R.2    Nicollian, E.H.3
  • 4
    • 0001651260 scopus 로고    scopus 로고
    • Quantum confinement in Si nanocrystals
    • B. Delley and E.F. Steigmeier, "Quantum confinement in Si nanocrystals", Phys. Rev. B 47, 1997, pp. 1397-1400.
    • (1997) Phys. Rev. , vol.B 47 , pp. 1397-1400
    • Delley, B.1    Steigmeier, E.F.2
  • 5
    • 0030385344 scopus 로고    scopus 로고
    • Development of a-Si based p-i-n solar cell in a superstrate structure with p-microcrystalline Si as window layer
    • D. J. K. Rath, C.H.M. van der Werl, F. A. Rubinelli and R.E.I. Schropp, "Development of a-Si based p-i-n solar cell in a superstrate structure with p-microcrystalline Si as window layer", 25th IEEE PVSC, 1996, pp. 1101-1105.
    • (1996) 25th IEEE PVSC , pp. 1101-1105
    • Rath, D.J.K.1    Van Der Werl, C.H.M.2    Rubinelli, F.A.3    Schropp, R.E.I.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.