Industrial utilization of linguistic equations for defect detection on printed circuit boards

IECON Proceedings (Industrial Electronics Conference)

Volumn 3, Issue , 2002, Pages 1887-1892

  Gebus, Sébastien ^a   Juuso, Esko ^a  

^a UNIVERSITY OF OULU   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

FUNCTIONAL TESTING; FUZZY ALGORITHMS; LINGUISTIC EQUATIONS;

ALGORITHMS; DECISION SUPPORT SYSTEMS; EXPERT SYSTEMS; FUZZY CONTROL; LEARNING SYSTEMS; PRINTED CIRCUIT MANUFACTURE; SCADA SYSTEMS;

INTELLIGENT CONTROL;

EID: 0036957324     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IECON.2002.1185259     Document Type: Conference Paper

References (11)

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