Automatic fault localization at chip level

Microprocessors and Microsystems

Volumn 22, Issue 1, 1998, Pages 13-22

  Stout, Rob D L ^a   Van De Goor, A J ^a,b   Wolff, Roger E ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Chip level automatic test; Diagnostic test; Functional test; Power on test

Indexed keywords

INTEGRATED CIRCUIT TESTING; PRINTED CIRCUIT TESTING; SURFACE MOUNT TECHNOLOGY;

AUTOMATIC FAULT LOCALIZATION;

MICROPROCESSOR CHIPS;

EID: 0032095929     PISSN: 01419331     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0141-9331(97)00027-6     Document Type: Article

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