Validation of an SEU simulation technique for a complex processor: PowerPC7400

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 6, 2002, Pages 3156-3162

  Rezgui, Sana ^a   Swift, Gary M ^b   Velazco, Raoul ^a   Farmanesh, Farhad F ^b  

^a TIMA LABORATORY   (France)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Extraterrestrial radiation effects; Fault injection; Heavy ion testing; Integrated circuit radiation effects; Integrated circuit testing; Ion radiation effects; Microprocessor testing; PowerPC7400; Processor errors; Radiation effects

Indexed keywords

BENCHMARKING; COMPUTER SIMULATION; DATA STORAGE EQUIPMENT; HEAVY IONS; INTEGRATED CIRCUITS; RADIATION EFFECTS;

COMPLEX PROCESSORS;

MICROPROCESSOR CHIPS;

EID: 0036952552     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.805982     Document Type: Conference Paper

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