Local mapping of the oxygen-boron complex in 2×2 cm2 and 10×10 cm2 high-efficiency CZ-SI solar cells by lock-in thermography and LBIC

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2002, Pages 434-437

  Rakotoniaina, Jean P ^a   Breitenstein, Otwin ^a   Zhao, Jianhua ^b   Wang, Aihua ^b   Green, Martin A ^b   Rein, Stefan ^c   Glunz, Stefan W ^c  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

^c FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BORON; DEGRADATION; ELECTRIC CURRENTS; GRAPH THEORY; OXYGEN;

CZOCHRALSKI MATERIAL; LOCK IN THERMOGRAPHY; SOLAR CELL PARAMETERS;

SILICON SOLAR CELLS;

EID: 0036948562     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. J. Schmidt, A.G. Aberle, R. Hezel, "Investigation of Carrier Lifetime Instabilities in CZ-Grown Silicon", 26th IEEE PVSC, 1997, pp. 13-18.
2. H. Hashigami, Y. Itakura, A. Takai, S. Rein, S.W. Glunz, T. Saitoh, "Impact of carrier injection level on light-induced degradation of Cz-Si Solar Cell Performance", Contribution at 17th Eur. PVSEC, Munich 2001, in print
3. S.W. Glunz, S. Rein, J.Y. Lee and W. Warta, "Minority carrier lifetime degradation in boron-doped Czochralski silicon", Journal of Applied Physics 90(5), 2001, pp.2397-2404.
4. O. Breitenstein, M. Langenkamp, O. Lang, A. Schirrmacher: "Shunts due to Laser Scribing of Solar Cells Evaluated by Highly Sensitive Lock-in Thermography", Solar Energy Materials & Solar Cells 65, 2001, pp. 55-62.
5. O. Breitenstein, M. Langenkamp, K.R. McIntosh, C.B. Honsberg, M. Rinio: "Localization of Shunts Across the Floating Junction of DSBC Solar Cells by Lock-in Thermography", Proc. 28th IEEE PVSC, 2000, pp. 124-127.
6. J. Zhao, A. Wang, M. Green, "24.5% efficiency PERT silicon solar cells on SEH MCZ substrates and cell performance on other SEH CZ and FZ substrates", Solar Energy Materials & Solar Cells 66, 2001, pp 27.36.
7. O. Breitenstein, J.P. Rakotoniaina, S. Neve, M.A. Green, J. Zhao, A. Wang, G. Hahn, "Lock-in Thermography Investigation of Shunts in Screen-Printed and PERT Solar Cells", this conference.
8. S. Rein, T. Rehrl, W. Warta and S.W. Glunz, "Electrical and thermal properties of the metastable defect in boron-doped Czochralski silicon (Cz-Si)", Proceedings of the 17th European Photovoltaic Solar Energy Conference, Munich, Germany, to be published (2001).