Laser-fired contacts - Transfer of a simple high efficiency process scheme to industrial production

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2002, Pages 130-133

  Preu, R ^a   Schneiderlochner E ^a   Grohe, A ^a   Glunz, S W ^a   Willeke, G ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ELECTRIC CONTACTS; ENERGY EFFICIENCY; LASER APPLICATIONS; MIRRORS; PASSIVATION; PRODUCTIVITY; SILICON WAFERS; SURFACES;

ALUMINUM BACK SURFACE FIELD; INDUSTRIAL PRODUCTION; LASER FIRED CONTACTS; SCANNING MIRRORS; SURFACE PASSIVATION;

SILICON SOLAR CELLS;

EID: 0036948544     PISSN: 01608371     EISSN: None     Source Type: Journal    
DOI: 10.1109/PVSC.2002.1190473     Document Type: Article

References (11)

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2. A. Metz and R. Hezel, “High-Quality Passivated Rear Contact Structure For Silicon Solar Cells Based On Simple Mechanical Abrasion”, Proc. 28th IEEE PVSC, 2000, pp. 172-175.
3. E. Schneiderlöchner, et al., “Laser-Fired Contacts”, Proc. 17th IEEE PVSC, 2001, to be published.
4. R. Preu, et al., “Verfahren zur Herstellung eines Halbleiter-Metallkontakts durch eine dielektriche Schicht,” 2000, WO 02/25742.
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6. E. Schneiderlöchner, et al., “Laser-Fired Rear Contacts for Crystalline Silicon Solar Cells”, Progr. Photovolt. 10, 2002, pp. 29-34.
7. E. Schneiderlöchner, et al., “Investigations on Laser-fired Contacts for Passivated Rear Solar Cells”, 2002, this conference.
8. S. Dauwe, et al., “Loss Mechanisms in Silicon Nitride Rear Surface Passivation for Silicon Solar Cells”, 17th IEEE PVSC, 2001, to be published.
9. G. Emanuel, et al., “High Throughput Laser Isolation of Crystalline Silicon Solar Cells”, Proc. 17th IEEE PVSC, 2001, to be published.
10. P. Lölgen, et al., “Aluminium Back-Surface Field Doping Profiles With Surface Recombination Velocities Below 200 cm/s”, Proc. 23rd IEEE PVSC, 1993, pp. 236.
11. R. Preu, et al., “Innovative Production Technologies for Solar Cells - SOLPRO”, Proc. 16th EU PVSEC, 2000, pp. 1551-1454.