High-quality passivated rear contact structure for silicon solar cells based on simple mechanical abrasion

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn 2000-January, Issue , 2000, Pages 172-175

  Metz, Axel ^a   Hezel, Rudolf ^a  

^a INSTITUTE FOR SOLAR ENERGY RESEARCH HAMELIN ISFH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABRASION; CRYSTAL DEFECTS; PASSIVATION; POINT CONTACTS; SOLAR CELLS;

BACK SURFACE FIELDS; CONTACT OPENING; DIELECTRIC LAYER; INDUSTRIAL SIZE; LABORATORY SIZE; MECHANICAL ABRASION; SOLAR CELL PERFORMANCE; STRUCTURE EFFICIENCIES;

SILICON SOLAR CELLS;

EID: 84949557913     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2000.915781     Document Type: Conference Paper

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