Orientation maps on TEM

Materials Science Forum

Volumn 408-412, Issue I, 2002, Pages 209-214

  Fundenberger, J J ^a   Bouzy, E ^a   Morawiec, A ^b   Lecomte, J S ^a  

^a UNIVERSITÉ DE LORRAINE   (France)

^b INSTITUTE OF METALLURGY AND MATERIALS SCIENCE   (Poland)

Author keywords

CBED Patterns; Image Analysis; Indexing; Kikuchi Patterns; Orientation Maps

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; CRYSTAL MICROSTRUCTURE; ELECTRON BEAMS; IMAGING SYSTEMS; MATERIALS SCIENCE; MICROSTRUCTURE; PLASTIC DEFORMATION; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

TRANSMISSION MICROSCOPES;

CRYSTAL ORIENTATION;

EID: 0036946902     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.408-412.209     Document Type: Conference Paper

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