Determination of Si δ-doping concentration in GaN by electroreflectance

Physica Status Solidi (B) Basic Research

Volumn 234, Issue 3, 2002, Pages 868-871

  Drabinska A ^a   Korona, K P ^a   Bozek, R ^a   Babinski A ^a   Baranowski, J M ^a   Pacuski, W ^a   Stepniewski R ^a   Tomaszewicz, T ^a  

^a UNIVERSITY OF WARSAW   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036929445     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200212)234:3<868::AID-PSSB868>3.0.CO;2-H     Document Type: Conference Paper

References (5)

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5. D.E. Aspnes and A.A. Studna, Phys. Rev. B 7, 4605 (1973).