Theoretical and practical validation of combined BEM/FEM substrate resistance modeling

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 2002, Pages 10-15

  Schrik, E ^a   Dewilde, P M ^a   Van Der Meijs, N P ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DISCRETIZATION; SUBSTRATE RESISTANCE;

BOUNDARY ELEMENT METHOD; ELECTRIC RESISTANCE; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; SPURIOUS SIGNAL NOISE; SUBSTRATES; THREE DIMENSIONAL;

COMPUTER AIDED NETWORK ANALYSIS;

EID: 0036915661     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/774572.774574     Document Type: Conference Paper

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