Low-frequency noise analysis of Si/SiGe channel pMOSFETs

Solid-State Electronics

Volumn 46, Issue 12, 2002, Pages 2281-2285

  Li, P W ^a   Liao, W M ^a  

^a NATIONAL CENTRAL UNIVERSITY   (Taiwan)

Author keywords

1 f noise; Flicker noise; MOSFETs; SiGe

Indexed keywords

CHARGE CARRIERS; FERMI LEVEL; FREQUENCIES; INTERFACES (MATERIALS); SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SPURIOUS SIGNAL NOISE;

FLICKER NOISE;

MOSFET DEVICES;

EID: 0036890561     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(02)00231-9     Document Type: Article

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